IEC 63185:2020 pdf free download

IEC 63185:2020 pdf free download Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
1 Scope
This document relates to a measurement method for complexpermittivity of a dielectricsubstrates at microwave and millimeter-wave frequencies.This method has been developed to
evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wavecircuits and devices. It uses higher-order modes of a balanced-type circular disk resonator andprovides broadband measurements of dielectric substrates by using one resonator, where the
effect of excitation holes is taken into account accurately on the basis of the mode-matchinganalysis.
In comparison with the conventional method described in IEC 62810 and IEC 61338-1-3, thismethod has the following characteristics:
. the values of the relative permittivity&r’ and loss tangent tanb normal to dielectric platesamples can be measured accurately and non-destructively;
. this method presents broadband measurements by using higher-order modes by one
resonator;
this method is applicable for the measurements on the following condition:-frequency:
10 GHz ≤f≤ 110 GHz;
– relative permittivity:
1 ≤ &r≤ 10;
-loss tangent:
10-4 ≤ tan8 ≤10-2.
2Normative references
The following documents are referred to in the text in such a way that some or all of their contentconstitutes requirements of this document.For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document(including anyamendments) applies.
IEC 61338-1-3:1999， Waveguide type dielectric resonators – Part 1-3: General information andtest conditions – Measurement method of complex relative permittivity for dielectric resonatormaterials at microwave frequency
IEC 62810:2015, Cylindrical cavity method to measure the complex permittivity of low-lossdielectric rods
3Terms and definitions
No terms and definitions are listed in this document.
4 Measurement parameters
The measurement parameters are defined as follows:
ε r = ε r ’ – j ε r ” (1)
tanδ =ε r ”/ε r ’
where ε r ’ and ε r ” are the real and imaginary parts of the complex relative permittivity ε r .
5 Theory and calculation equations
A resonator structure used in this method is shown in Figure 1. A thin circular conductor disk with radius R is sandwiched between a pair of dielectric plate samples to be measured having the same thickness t and dielectric properties ε r ‘ and tan δ. Dielectric samples are sandwiched by two parallel conductor plates.
The thickness of the conductor disk is negligibly thin in the analysis. The resonator is excited and detected by coaxial lines through excitation holes having radius a and length M. Because only the TM 0m0 modes have the electric field in the center of the resonator, only those modes are selectively excited in the resonator, where the electric field components in the resonator are normal to the plate samples for those modes.