UL 61215-1-3:2021 free download

UL 61215-1-3:2021 free download Terrestrial Photovoltaic (PV) Modules – Design Qualification and Type Approval – Part 1-3: Special Requirements for Testing of Thin-Film Amorphous Silicon Based Photovoltaic (PV) Modules
Amorphous silicon based thin-film PV modules shall only be stabilized through indoor light soaking. Due to the non-controllable outdoor conditions, an outdoor method is considered not to deliver reproducible results.
11.19.1 Criterion definition for stabilization
For the definition of stabilization as per MQT 19 of IEC 61215-2:2021 x = 0,02 shall be used.
Any kind of storage shall be done at temperature below 25 °C to avoid thermally activated processes affecting MQT 06.1 of IEC 61215-2:2021 measurement.
11.19.2 Light induced stabilization procedures
This test of IEC 61215-2:2021 is applicable with the following modifications.
11.19.2.1 Apparatus for indoor stabilization
In IEC 61215-2:2021, 4.19.3.1 replace item d) with: “Use the reference device to set the irradiance between 600 W/m 2 and 1 000 W/m 2 . Record the irradiance.”
In IEC 61215-2:2021, 4.19.3.1 replace item e) with: “During the simulator exposure, the module temperature shall stay below 55 °C.”
NOTE Most a-Si containing active layers are known to anneal at module temperatures above 55 °C very quickly.
11.19.2.2 Requirements for outdoor exposure for stabilization
This test of IEC 61215-2:2021 is not applicable
11.19.3 Other stabilization procedures
At present no alternative stabilization methods are applicable.
11.19.4 Initial stabilization (MQT 19.1)
Initial stabilization is performed on all modules.
Initial stabilization shall be obtained by exposing the modules to simulated sunlight.
To fulfil MQT 19 requirements using light exposure, a minimum of two intervals each of at least 43 kWh/m 2 are required. After this preconditioning all of the test modules shall be measured for STC power (MQT 06.1 of IEC 61215-2:2021).
Output power determination shall be performed after a minimum cooling time of 30 min.
Exposure doses of 200 kWh/m 2 to 400 kWh/m 2 are typically necessary to reach stabilization of amorphous silicon thin-film modules.
11.19.5 Final stabilization (MQT 19.2)
Final stabilization is performed on all modules after the test sequences to prove fulfilment of gate No. 2 requirement of IEC 61215-1:2021.
To fulfil MQT 19 requirements a minimum of two intervals of at least 43 kWh/m 2 each are required.
Exposure doses of 200 kWh/m 2 to 400 kWh/m 2 are typically necessary to reach stabilization of amorphous silicon thin-film modules.
For modules that have been subjected to potential induced degradation (PID) stress (MQT 21), the maximum exposure limit after reaching stabilization shall not be exceeded. The light soak shall terminate no more than 86 kWh/m 2 after the stabilization criterion is met.
Output power determination shall be performed after a minimum cooling time of 30 min.
11.20 Cyclic (dynamic) mechanical load test (MQT 20)
This test of IEC 61215-2:2021 is applicable without modifications.
11.21 Potential induced degradation test (MQT 21)
This test of IEC 61215-2 is applicable without modifications.
11.22 Bending test (MQT 22)
This test of IEC 61215-2:2021 is applicable to flexible modules without modifications.